Paolo Spirito

Publication Activity (10 Years)

Years Active: 1990-2012
Publications (10 Years): 0

Top Topics

Electronic Devices

Finite Element Analysis

Electrical Power

Top Venues

Microelectron. Reliab.

Publications

Michele Riccio, Giuseppe De Falco, Luca Maresca, Giovanni Breglio, Ettore Napoli, Andrea Irace, Yohei Iwahashi, Paolo Spirito
3D electro-thermal simulations of wide area power devices operating in avalanche condition. Microelectron. Reliab. 52 (9-10) (2012)
Michele Riccio, Lucio Rossi, Andrea Irace, E. Napoli, Giovanni Breglio, Paolo Spirito, Ryuzo Tagami, Yoshihito Mizuno
Analysis of large area Trench-IGBT current distribution under UIS test with the aid of lock-in thermography. Microelectron. Reliab. 50 (9-11) (2010)
Lucio Rossi, Michele Riccio, E. Napoli, Andrea Irace, Giovanni Breglio, Paolo Spirito
A novel UIS test system with Crowbar feedback for reduced failure energy in power devices testing. Microelectron. Reliab. 50 (9-11) (2010)
Lucio Rossi, Michele Riccio, E. Napoli, Andrea Irace, Giovanni Breglio, Paolo Spirito
1300 V, 2 ms pulse inductive load switching test circuit with 20 ns selectable crowbar intervention. Microelectron. Reliab. 49 (9-11) (2009)
Giovanni Breglio, Andrea Irace, E. Napoli, Michele Riccio, Paolo Spirito, K. Hamada, T. Nishijima, T. Ueta
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography. Microelectron. Reliab. 48 (8-9) (2008)
Andrea Irace, Giovanni Breglio, Paolo Spirito
, a tool for 3D electro-thermal simulation of smart power MOSFETs. Microelectron. Reliab. 47 (9-11) (2007)
Giovanni Breglio, Andrea Irace, E. Napoli, Paolo Spirito, K. Hamada, T. Nishijima, T. Ueta
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. Microelectron. Reliab. 47 (9-11) (2007)
Andrea Irace, Giovanni Breglio, Paolo Spirito, A. Bricconi, Diego Raffo, Luigi Merlin
Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode. Microelectron. Reliab. 46 (9-11) (2006)
Andrea Irace, Giovanni Breglio, Paolo Spirito, Romeo Letor, Sebastiano Russo
Reliability enhancement with the aid of transient infrared thermal analysis of smart Power MOSFETs during short circuit operation. Microelectron. Reliab. 45 (9-11) (2005)
E. D'Arcangelo, Andrea Irace, Giovanni Breglio, Paolo Spirito
Experimental characterization of temperature distribution on Power MOS devices during Unclamped Inductive Switching. Microelectron. Reliab. 44 (9-11) (2004)
Salvatore Bellone, Paolo Spirito
A new test structure for recombination measurements in thin si layers for VLSI structures. Eur. Trans. Telecommun. 1 (3) (1990)