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Detection of localized UIS failure on IGBTs with the aid of lock-in thermography.
Giovanni Breglio
Andrea Irace
E. Napoli
Michele Riccio
Paolo Spirito
K. Hamada
T. Nishijima
T. Ueta
Published in:
Microelectron. Reliab. (2008)
Keyphrases
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automatic detection
detection method
detection accuracy
object detection
detection algorithm
detection rate
false positives
conceptual models
real time
face detection
false alarms
automated detection
real world
computer vision
change detection
event detection