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A new test structure for recombination measurements in thin si layers for VLSI structures.
Salvatore Bellone
Paolo Spirito
Published in:
Eur. Trans. Telecommun. (1990)
Keyphrases
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complex structures
structural features
genetic algorithm
high speed
mobile robot
building blocks
graph structure
single chip
multiscale
low cost
signal processing
x ray
hierarchical structure
statistical significance