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Fast thermal fatigue on top metal layer of power devices.
Sebastiano Russo
Romeo Letor
Orazio Viscuso
Lucia Torrisi
Gianluigi Vitali
Published in:
Microelectron. Reliab. (2002)
Keyphrases
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high temperature
power consumption
electrical power
multi layer
mobile devices
processing capabilities
application layer
embedded devices
silicon dioxide
data sets
battery life
grain size
transmission line
personal computer
mobile applications
high speed
low cost