R. Hoffmann

Publication Activity (10 Years)

Years Active: 1976-2022
Publications (10 Years): 3

Top Topics

Reliability Analysis

Leakage Current

Top Venues

Publications

T. Ali, Ricardo Olivo, S. Kerdilès, David Lehninger, Maximilian Lederer, D. Sourav, A.-S. Royet, Ayse Sünbül, A. Prabhu, Kati Kühnel, Malte Czernohorsky, M. Rudolph, R. Hoffmann, Christelle Charpin-Nicolle, Laurent Grenouillet, Thomas Kämpfe, Konrad Seidel
Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability. IMW (2022)
Yannick Raffel, Ricardo Olivo, Maximilian Lederer, F. Müller, R. Hoffmann, T. Ali, Konstantin Mertens, Luca Pirro, Maximilian Drescher, Sven Beyer, Thomas Kämpfe, Konrad Seidel, Lukas M. Eng, J. Heitmann
Endurance improvements and defect characterization in ferroelectric FETs through interface fluorination. IMW (2022)
A. Viegas, K. Falidas, T. Ali, Kati Kühnel, R. Hoffmann, Clemens Mart, M. Czernohorsky, J. Heitmann
Reliability of Ferroelectric and Antiferroelectric Si: HfO2 materials in 3D capacitors by TDDB studies. IRPS (2022)
Johannes Ocker, Stefan Slesazeck, Thomas Mikolajick, S. Buschbeck, S. Günther, E. Yurchuk, R. Hoffmann, V. Beyer
On the voltage scaling potential of SONOS non-volatile memory transistors. ESSDERC (2015)
J. Helbig, R. Hoffmann, A. Kallich
Verbesserung der automatischen Erkennung gesprochener Ziffern mit Telefonqualität. DAGM-Symposium (1992)
Wolfgang K. Giloi, R. Hoffmann
Adding a modern control structure to APL without changing the syntax. APL (1976)