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Munaf Rahimo
ORCID
Publication Activity (10 Years)
Years Active: 2014-2023
Publications (10 Years): 7
Top Topics
Planar Surfaces
Gallium Arsenide
Short Circuit
Conceptual Modelling
Top Venues
Microelectron. Reliab.
ITSC
IEEE Trans. Ind. Electron.
IET Circuits Devices Syst.
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Publications
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Luca Sandel
,
Gioele Zardini
,
Sofija Mitrova
,
Tanya Thekemuriyil
,
Renato Minamisawa
,
Munaf Rahimo
,
Andrea Censi
,
Emilio Frazzoli
,
Silvia Mastellone
Enhancing Efficiency and Reliability of Electric Vehicles via Adaptive E-Gear Control.
ITSC
(2023)
Dragan Stamenkovic
,
Umamaheswara Vemulapati
,
Thomas Stiasny
,
Munaf Rahimo
,
Drazen Dujic
IGCT Low-Current Switching - TCAD and Experimental Characterization.
IEEE Trans. Ind. Electron.
67 (8) (2020)
Charalampos Papadopoulos
,
Chiara Corvasce
,
Arnost Kopta
,
Daniel Schneider
,
Gontran Pâques
,
Munaf Rahimo
The influence of humidity on the high voltage blocking reliability of power IGBT modules and means of protection.
Microelectron. Reliab.
(2018)
Silvan Geissmann
,
L. De Michielis
,
Chiara Corvasce
,
Munaf Rahimo
,
M. Andenna
Extraction of dynamic avalanche during IGBT turn off.
Microelectron. Reliab.
(2017)
Paula Diaz Reigosa
,
Francesco Iannuzzo
,
Munaf Rahimo
,
Frede Blaabjerg
Capacitive effects in IGBTs limiting their reliability under short circuit.
Microelectron. Reliab.
(2017)
Paula Diaz Reigosa
,
D. Prindle
,
Gontran Pâques
,
Silvan Geissmann
,
Francesco Iannuzzo
,
Arnost Kopta
,
Munaf Rahimo
Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT.
Microelectron. Reliab.
64 (2016)
Munaf Rahimo
,
Frank Richter
,
Fabian Fischer
,
Umamaheswara Vemulapati
,
Arnost Kopta
,
Chiara Corvasce
,
Silvan Geissmann
,
Marco Bellini
,
Martin J. Bayer
,
Friedhelm Bauer
The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination.
Microelectron. Reliab.
58 (2016)
Umamaheswara Vemulapati
,
Nando Kaminski
,
Dieter Silber
,
Liutauras Storasta
,
Munaf Rahimo
Reverse conducting-IGBTs initial snapback phenomenon and its analytical modelling.
IET Circuits Devices Syst.
8 (3) (2014)