Paula Diaz Reigosa

Publication Activity (10 Years)

Years Active: 2015-2018
Publications (10 Years): 10

Top Topics

Electrical Power

Meteorological Data

Top Venues

Microelectron. Reliab.

Publications

Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli
dielectric in SiC power MOSFETs. Microelectron. Reliab. (2018)
Mohsen Akbari, Amir Sajjad Bahman, Paula Diaz Reigosa, Francesco Iannuzzo, Mohammad Tavakoli Bina
Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions. Microelectron. Reliab. (2018)
H. Du, Paula Diaz Reigosa, Francesco Iannuzzo, Lorenzo Ceccarelli
Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules. Microelectron. Reliab. (2018)
Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. Microelectron. Reliab. (2018)
E. M. S. Brito, Allan Fagner Cupertino, Paula Diaz Reigosa, Yongheng Yang, Victor Flores Mendes, Heverton Augusto Pereira
Impact of meteorological variations on the lifetime of grid-connected PV inverters. Microelectron. Reliab. (2018)
Lorenzo Ceccarelli, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg
A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis. Microelectron. Reliab. (2017)
Lorenzo Ceccarelli, Paula Diaz Reigosa, Amir Sajjad Bahman, Francesco Iannuzzo, Frede Blaabjerg
Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions. IECON (2017)
Paula Diaz Reigosa, Francesco Iannuzzo, Munaf Rahimo, Frede Blaabjerg
Capacitive effects in IGBTs limiting their reliability under short circuit. Microelectron. Reliab. (2017)
Paula Diaz Reigosa, D. Prindle, Gontran Pâques, Silvan Geissmann, Francesco Iannuzzo, Arnost Kopta, Munaf Rahimo
Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT. Microelectron. Reliab. 64 (2016)
Haoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He
Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview. Microelectron. Reliab. 58 (2016)
Paula Diaz Reigosa, Rui Wu, Francesco Iannuzzo, Frede Blaabjerg
Robustness of MW-Level IGBT modules against gate oscillations under short circuit events. Microelectron. Reliab. 55 (9-10) (2015)