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A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis.
Lorenzo Ceccarelli
Paula Diaz Reigosa
Francesco Iannuzzo
Frede Blaabjerg
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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quantitative analysis
image processing
artificial neural networks
cost effective
qualitative analysis
short circuit