Haoze Luo

Publication Activity (10 Years)

Years Active: 2015-2023
Publications (10 Years): 9

Top Topics

Condition Monitoring

Leakage Current

Light Emitting Diodes

Top Venues

IEEE Trans. Ind. Electron.

Microelectron. Reliab.

Publications

Jianlong Kang, Qing Liu, Haoze Luo, Hu Cao, Zi-Hui Zhang, Zhen Xin
Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition. IEEE Trans. Ind. Electron. 70 (5) (2023)
Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao, Xiangning He, Nick Wright
AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer. IEEE Trans. Ind. Electron. 66 (10) (2019)
Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. Microelectron. Reliab. (2018)
Haoze Luo, Wuhua Li, Francesco Iannuzzo, Xiangning He, Frede Blaabjerg
Enabling Junction Temperature Estimation via Collector-Side Thermo-Sensitive Electrical Parameters Through Emitter Stray Inductance in High-Power IGBT Modules. IEEE Trans. Ind. Electron. 65 (6) (2018)
Lorenzo Ceccarelli, Haoze Luo, Francesco Iannuzzo
Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter. Microelectron. Reliab. (2018)
Haoze Luo, Wuhua Li, Xiangning He, Francesco Iannuzzo, Frede Blaabjerg
Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design. Microelectron. Reliab. (2017)
Haoze Luo, Francesco Iannuzzo, Frede Blaabjerg, Wuhua Li, Xiangning He
Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules. IECON (2017)
Haoze Luo, Nick Baker, Francesco Iannuzzo, Frede Blaabjerg
Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules. Microelectron. Reliab. (2017)
Haoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He
Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview. Microelectron. Reliab. 58 (2016)
Wuhua Li, Chi Xu, Haoze Luo, Yihua Hu, Xiangning He, Changliang Xia
Decoupling-Controlled Triport Composited DC/DC Converter for Multiple Energy Interface. IEEE Trans. Ind. Electron. 62 (7) (2015)
Sheng Zong, Haoze Luo, Wuhua Li, Xiangning He, Changliang Xia
Theoretical Evaluation of Stability Improvement Brought by Resonant Current Loop for Paralleled LLC Converters. IEEE Trans. Ind. Electron. 62 (7) (2015)
Wuhua Li, Yunjie Gu, Haoze Luo, Wenfeng Cui, Xiangning He, Changliang Xia
Topology Review and Derivation Methodology of Single-Phase Transformerless Photovoltaic Inverters for Leakage Current Suppression. IEEE Trans. Ind. Electron. 62 (7) (2015)