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Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules.
Haoze Luo
Nick Baker
Francesco Iannuzzo
Frede Blaabjerg
Published in:
Microelectron. Reliab. (2017)
Keyphrases
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energy dissipation
computational power
power consumption
statistical tests
allocation scheme
data sets
neural network
genetic algorithm
evolutionary algorithm
control system
knowledge structures
software aging