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Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules.

Haoze LuoNick BakerFrancesco IannuzzoFrede Blaabjerg
Published in: Microelectron. Reliab. (2017)
Keyphrases
  • energy dissipation
  • computational power
  • power consumption
  • statistical tests
  • allocation scheme
  • data sets
  • neural network
  • genetic algorithm
  • evolutionary algorithm
  • control system
  • knowledge structures
  • software aging