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Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition.

Jianlong KangQing LiuHaoze LuoHu CaoZi-Hui ZhangZhen Xin
Published in: IEEE Trans. Ind. Electron. (2023)
Keyphrases
  • short circuit
  • state space
  • sufficient conditions
  • real time
  • artificial intelligence
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  • particle swarm optimization