Sign in
Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules.
H. Du
Paula Diaz Reigosa
Francesco Iannuzzo
Lorenzo Ceccarelli
Published in:
Microelectron. Reliab. (2018)
Keyphrases
</>
short circuit
thin film
power dissipation
electrical power
power consumption
transmission line
reactive power
neural network
computer vision
pattern recognition
rough sets
power system
radial basis function
induction motor