The impact on power semiconductor device operation due to local electric field alterations in the planar junction termination.
Munaf RahimoFrank RichterFabian FischerUmamaheswara VemulapatiArnost KoptaChiara CorvasceSilvan GeissmannMarco BelliniMartin J. BayerFriedhelm BauerPublished in: Microelectron. Reliab. (2016)