EXTERNAL FORCE
Experts
- Anthony J. Yezzi
- Kwang Nam Choi
- Yuanquan Wang
- Scott T. Acton
- Allen R. Tannenbaum
- Xianghua Xie
- Michel Barlaud
- Laurent D. Cohen
- Dimitris N. Metaxas
- Wilfred F. van Gunsteren
- Faouzi Ghorbel
- Jean-Philippe Thiran
- Farhan Akram
- Foued Derraz
- Alexander D. MacKerell Jr.
- Kannappan Palaniappan
- Shafiullah Soomro
- Xavier Bresson
- Ming Cao
- Weijia Yao
- Laurent Peyrodie
- Sebastiano Battiato
- Nassir Navab
- Van-Truong Pham
- Thi-Thao Tran
- Holger Theisel
- Yiquan Wu
- Julian von Wilmsdorff
- Filiz Bunyak
- Chunrong Peng
- Giovanni Puglisi
- Demetri Terzopoulos
- Chunming Li
- Diana Veiga
- Paul W. Fieguth
- Guirong Weng
- Juan Gabriel Aviña-Cervantes
- Maximilian Baust
- Yunde Jia
Venues
- J. Comput. Chem.
- CoRR
- ICIP
- IEEE Access
- EMBC
- Medical Imaging: Image Processing
- ICRA
- ISBI
- Pattern Recognit.
- Sensors
- IROS
- IEEE Trans. Image Process.
- J. Chem. Inf. Model.
- IEEE Trans. Instrum. Meas.
- Medical Image Anal.
- ICPR
- CVPR
- Signal Process.
- Pattern Recognit. Lett.
- EUSIPCO
- Comput. Biol. Medicine
- Comput. Math. Methods Medicine
- Multim. Tools Appl.
- IEEE Trans. Biomed. Eng.
- Int. J. Bifurc. Chaos
- J. Electronic Imaging
- SMC
- ICCV
- BMVC
- Image Vis. Comput.
- IEEE Trans. Vis. Comput. Graph.
- CDC
- J. Comput. Aided Mol. Des.
- J. Math. Imaging Vis.
- ICASSP
- IGARSS
- IEEE Trans. Medical Imaging
- ICIP (3)
- IEEE Trans. Pattern Anal. Mach. Intell.
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