Masanori Usui

Publication Activity (10 Years)

Years Active: 2002-2017
Publications (10 Years): 6

Top Topics

Electronic Devices

Blind Equalization Algorithm

Positive Effects

Thermal Imaging

Top Venues

Microelectron. Reliab.

Publications

Masanori Usui, Toshikazu Satoh, Hidehiko Kimura, S. Tajima, Y. Hayashi, D. Setoyama, Masashi Kato
Effects of thermal aging on Cu nanoparticle/Bi-Sn solder hybrid bonding. Microelectron. Reliab. 78 (2017)
T. Ishizaki, D. Miura, A. Kuno, K. Hasegawa, Masanori Usui, Y. Yamada
Young's modulus of a sintered Cu joint and its influence on thermal stress. Microelectron. Reliab. (2017)
Masanori Usui, Hidehiko Kimura, Toshikazu Satoh, Takashi Asada, Satoshi Yamaguchi, Masashi Kato
Degradation of a sintered Cu nanoparticle layer studied by synchrotron radiation computed laminography. Microelectron. Reliab. 63 (2016)
T. Ishizaki, D. Miura, A. Kuno, R. Nagao, S. Aoki, Y. Ohshima, T. Kino, Masanori Usui, Y. Yamada
Power cycle reliability of Cu nanoparticle joints with mismatched coefficients of thermal expansion. Microelectron. Reliab. 64 (2016)
T. Ishizaki, Masanori Usui, Y. Yamada
Thermal cycle reliability of Cu-nanoparticle joint. Microelectron. Reliab. 55 (9-10) (2015)
T. Ishizaki, M. Yanase, A. Kuno, T. Satoh, Masanori Usui, F. Osawa, Y. Yamada
Thermal simulation of joints with high thermal conductivities for power electronic devices. Microelectron. Reliab. 55 (7) (2015)
Takashi Asada, Yuji Yagi, Masanori Usui, T. Suzuki, Nobutada Ohno
Warpage analysis of layered structures connected by direct brazing. Microelectron. Reliab. 51 (9-11) (2011)
Masayasu Ishiko, Masanori Usui, Takashi Ohuchi, Mikio Shirai
Design concept for wire-bonding reliability improvement by optimizing position in power devices. Microelectron. J. 37 (3) (2006)
Masanori Usui, Masayasu Ishiko, Koji Hotta, Satoshi Kuwano, Masato Hashimoto
Effects of uni-axial mechanical stress on IGBT characteristics. Microelectron. Reliab. 45 (9-11) (2005)
Masanori Usui, Takahide Sugiyama, Masayasu Ishiko, Jun Morimoto, Hirokazu Saitoh, Masaki Ajioka
Characterization of Trench MOS Gate Structures Utilizing Photon Emission Microscopy. Microelectron. Reliab. 42 (9-11) (2002)