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Leon Chou
Publication Activity (10 Years)
Years Active: 2019-2021
Publications (10 Years): 6
Top Topics
Unsupervised Clustering
Machine Learning
Square Grid
Ensemble Classifier
Top Venues
ITC
ETS
DATE
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Publications
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Katherine Shu-Min Li
,
Leon Li-Yang Chen
,
Ken Chau-Cheung Cheng
,
Peter Yi-Yu Liao
,
Sying-Jyan Wang
,
Andrew Yi-Ann Huang
,
Nova Cheng-Yen Tsai
,
Leon Chou
,
Gus Chang-Hung Han
,
Jwu E. Chen
,
Hsing-Chung Liang
,
Chun-Lung Hsu
Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering.
ETS
(2021)
Peter Yi-Yu Liao
,
Katherine Shu-Min Li
,
Leon Li-Yang Chen
,
Sying-Jyan Wang
,
Andrew Yi-Ann Huang
,
Ken Chau-Cheung Cheng
,
Nova Cheng-Yen Tsai
,
Leon Chou
WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques.
ITC
(2021)
Leon Li-Yang Chen
,
Katherine Shu-Min Li
,
Ken Chau-Cheung Cheng
,
Sying-Jyan Wang
,
Andrew Yi-Ann Huang
,
Leon Chou
,
Nova Cheng-Yen Tsai
,
Chen-Shiun Lee
TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning.
ITC
(2020)
Katherine Shu-Min Li
,
Peter Yi-Yu Liao
,
Leon Chou
,
Ken Chau-Cheung Cheng
,
Andrew Yi-Ann Huang
,
Sying-Jyan Wang
,
Gus Chang-Hung Han
PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques.
ETS
(2020)
Ken Chau-Cheung Cheng
,
Katherine Shu-Min Li
,
Andrew Yi-Ann Huang
,
Ji-Wei Li
,
Leon Li-Yang Chen
,
Nova Cheng-Yen Tsai
,
Sying-Jyan Wang
,
Chen-Shiun Lee
,
Leon Chou
,
Peter Yi-Yu Liao
,
Hsing-Chung Liang
,
Jwu E. Chen
Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis.
DATE
(2020)
Andrew Yi-Ann Huang
,
Katherine Shu-Min Li
,
Cheng-Yen Tsai
,
Ken Chau-Cheung Cheng
,
Sying-Jyan Wang
,
Xu-Hao Jiang
,
Leon Chou
,
Chen-Shiun Lee
TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning.
ITC
(2019)