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TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning.
Andrew Yi-Ann Huang
Katherine Shu-Min Li
Cheng-Yen Tsai
Ken Chau-Cheung Cheng
Sying-Jyan Wang
Xu-Hao Jiang
Leon Chou
Chen-Shiun Lee
Published in:
ITC (2019)
Keyphrases
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learning process
learning algorithm
reinforcement learning
learning tasks
learning phase
online learning
empirical studies
incremental learning
social networks
feature selection
active learning
hidden markov models
knowledge acquisition
learning systems