TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble Learning.
Leon Li-Yang ChenKatherine Shu-Min LiKen Chau-Cheung ChengSying-Jyan WangAndrew Yi-Ann HuangLeon ChouNova Cheng-Yen TsaiChen-Shiun LeePublished in: ITC (2020)
Keyphrases
- ensemble learning
- pattern recognition
- learning machines
- generalization ability
- ensemble methods
- support vector machine svm
- image processing
- computer vision
- ensemble classifier
- random forest
- image analysis
- feature extraction
- neural network
- base classifiers
- concept drift
- weak learners
- mutual subspace method
- machine learning
- unlabeled data
- genetic algorithm ga
- text classification
- dimensionality reduction