Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis.
Ken Chau-Cheung ChengKatherine Shu-Min LiAndrew Yi-Ann HuangJi-Wei LiLeon Li-Yang ChenNova Cheng-Yen TsaiSying-Jyan WangChen-Shiun LeeLeon ChouPeter Yi-Yu LiaoHsing-Chung LiangJwu E. ChenPublished in: DATE (2020)