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Wafer-Level Test Path Pattern Recognition and Test Characteristics for Test-Induced Defect Diagnosis.

Ken Chau-Cheung ChengKatherine Shu-Min LiAndrew Yi-Ann HuangJi-Wei LiLeon Li-Yang ChenNova Cheng-Yen TsaiSying-Jyan WangChen-Shiun LeeLeon ChouPeter Yi-Yu LiaoHsing-Chung LiangJwu E. Chen
Published in: DATE (2020)
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