Kevin S. Jones

Publication Activity (10 Years)

Years Active: 2011-2017
Publications (10 Years): 2

Top Topics

Field Effect Transistors

Top Venues

Microelectron. Reliab.

Publications

Patrick G. Whiting, Nicholas G. Rudawski, M. R. Holzworth, Stephen J. Pearton, Kevin S. Jones, Lu Liu, T. S. Kang, Fan Ren
Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contacts. Microelectron. Reliab. 70 (2017)
Patrick G. Whiting, M. R. Holzworth, A. G. Lind, Stephen J. Pearton, Kevin S. Jones, Lu Liu, T. S. Kang, Fan Ren, Y. Xin
Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 70 (2017)
Patrick G. Whiting, Nicholas G. Rudawski, M. R. Holzworth, Stephen J. Pearton, Kevin S. Jones, Lu Liu, T. S. Kang, Fan Ren
Under-gate defect formation in Ni-gate AlGaN/GaN high electron mobility transistors. Microelectron. Reliab. 52 (11) (2012)
E. A. Douglas, C. Y. Chang, B. P. Gila, M. R. Holzworth, Kevin S. Jones, Lu Liu, Jinhyung Kim, Soohwan Jang, Glen David Via, Fan Ren, Stephen J. Pearton
Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors. Microelectron. Reliab. 52 (1) (2012)
E. A. Douglas, C. Y. Chang, D. J. Cheney, B. P. Gila, Chi-Fai Lo, Liu Lu, M. R. Holzworth, Patrick G. Whiting, Kevin S. Jones, Glen David Via, Jinhyung Kim, Soohwan Jang, Fan Ren, Stephen J. Pearton
AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress. Microelectron. Reliab. 51 (2) (2011)