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T. S. Kang
Publication Activity (10 Years)
Years Active: 2012-2017
Publications (10 Years): 2
Top Topics
Field Effect Transistors
Electron Beam
Mathematical Morphology
Wide Range
Top Venues
Microelectron. Reliab.
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Publications
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Patrick G. Whiting
,
Nicholas G. Rudawski
,
M. R. Holzworth
,
Stephen J. Pearton
,
Kevin S. Jones
,
Lu Liu
,
T. S. Kang
,
Fan Ren
Nanocrack formation in AlGaN/GaN high electron mobility transistors utilizing Ti/Al/Ni/Au ohmic contacts.
Microelectron. Reliab.
70 (2017)
Patrick G. Whiting
,
M. R. Holzworth
,
A. G. Lind
,
Stephen J. Pearton
,
Kevin S. Jones
,
Lu Liu
,
T. S. Kang
,
Fan Ren
,
Y. Xin
Erosion defect formation in Ni-gate AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab.
70 (2017)
Patrick G. Whiting
,
Nicholas G. Rudawski
,
M. R. Holzworth
,
Stephen J. Pearton
,
Kevin S. Jones
,
Lu Liu
,
T. S. Kang
,
Fan Ren
Under-gate defect formation in Ni-gate AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab.
52 (11) (2012)