Glen David Via

Publication Activity (10 Years)

Years Active: 2011-2020
Publications (10 Years): 4

Top Topics

Integrated Circuit

Document Management

Multiresolution

Person Identification

Top Venues

Microelectron. Reliab.

J. Hardw. Syst. Secur.

Publications

Adam G. Kimura, Jon Scholl, James Schaffranek, Matthew Sutter, Andrew Elliott, Mike Strizich, Glen David Via
A Decomposition Workflow for Integrated Circuit Verification and Validation. J. Hardw. Syst. Secur. 4 (1) (2020)
B. S. Poling, Glen David Via, K. D. Bole, E. E. Johnson, J. M. McDermott
Commercial-off-the-shelf algan/gan hemt device reliability study after exposure to heavy ion radiation. Microelectron. Reliab. 68 (2017)
A. R. Arehart, A. Sasikumar, Glen David Via, B. S. Poling, E. R. Heller, S. A. Ringel
-0.57 eV trap in GaN. Microelectron. Reliab. 56 (2016)
A. Sasikumar, A. R. Arehart, Glen David Via, B. Winningham, B. S. Poling, E. R. Heller, S. A. Ringel
Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps. Microelectron. Reliab. 55 (11) (2015)
E. A. Douglas, C. Y. Chang, B. P. Gila, M. R. Holzworth, Kevin S. Jones, Lu Liu, Jinhyung Kim, Soohwan Jang, Glen David Via, Fan Ren, Stephen J. Pearton
Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors. Microelectron. Reliab. 52 (1) (2012)
E. A. Douglas, C. Y. Chang, D. J. Cheney, B. P. Gila, Chi-Fai Lo, Liu Lu, M. R. Holzworth, Patrick G. Whiting, Kevin S. Jones, Glen David Via, Jinhyung Kim, Soohwan Jang, Fan Ren, Stephen J. Pearton
AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress. Microelectron. Reliab. 51 (2) (2011)