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Identification of an RF degradation mechanism in GaN based HEMTs triggered by midgap traps.
A. Sasikumar
A. R. Arehart
Glen David Via
B. Winningham
B. S. Poling
E. R. Heller
S. A. Ringel
Published in:
Microelectron. Reliab. (2015)
Keyphrases
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data sets
computer vision
real time
three dimensional
selection mechanism
person identification
data mining
metadata
pattern recognition
digital libraries
information technology
multiresolution
gray scale
computational model
anti collision