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AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.

E. A. DouglasC. Y. ChangD. J. CheneyB. P. GilaChi-Fai LoLiu LuM. R. HolzworthPatrick G. WhitingKevin S. JonesGlen David ViaJinhyung KimSoohwan JangFan RenStephen J. Pearton
Published in: Microelectron. Reliab. (2011)
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