K. H. Tang

Publication Activity (10 Years)

Years Active: 2006-2019
Publications (10 Years): 1

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Publications

C. Y. He, K. H. Tang, T. S. Chen, K. Y. Chang, C. H. Lin, K. Sato, Shyh-Jye Jou, P. H. Chen, H. M. Chen, B. D. Rong, K. Itoh
Sub-ns Access Sub-mW/GHz 32 Kb SRAM with 0.45 V Cross-Point-5T Cell and Built-in Y_ Line. A-SSCC (2019)
K. M. Chen, K. H. Tang, J. S. Liu
Reliability evaluation of BOAC and normal pad stacked-chip packaging using low-K wafers. Microelectron. Reliab. 48 (3) (2008)
K. M. Chen, B. C. Wu, K. H. Tang, F. Y. Cheng, N. H. Kao, J. Y. Lai
An investigation into the effects of probing and wire bonding stress on the reliability of BOAC. Microelectron. Reliab. 46 (2-4) (2006)