B. C. Wu

Publication Activity (10 Years)

Years Active: 2006-2006
Publications (10 Years): 0

Publications

K. M. Chen, B. C. Wu, K. H. Tang, F. Y. Cheng, N. H. Kao, J. Y. Lai
An investigation into the effects of probing and wire bonding stress on the reliability of BOAC. Microelectron. Reliab. 46 (2-4) (2006)