C. H. Lin

Publication Activity (10 Years)

Years Active: 2003-2019
Publications (10 Years): 5

Top Topics

Experimental Study

Customer Demand

Top Venues

Microelectron. Reliab.

Publications

C. Y. He, K. H. Tang, T. S. Chen, K. Y. Chang, C. H. Lin, K. Sato, Shyh-Jye Jou, P. H. Chen, H. M. Chen, B. D. Rong, K. Itoh
Sub-ns Access Sub-mW/GHz 32 Kb SRAM with 0.45 V Cross-Point-5T Cell and Built-in Y_ Line. A-SSCC (2019)
T. T. Ku, Chao Shun Chen, C. H. Lin, Cheng Ting Hsu
Transformer management system for energy control of customer demand response and PV systems. IAS (2017)
M. Y. Tsai, C. H. Lin, K. F. Chuang, Y. H. Chang, C. T. Wu, S. C. Hu
Failure and stress analysis of through-aluminum-nitride-via substrates during thermal reliability tests for high power LED applications. Microelectron. Reliab. 67 (2016)
C. C. Yeh, Chao Shun Chen, T. T. Ku, C. H. Lin, Cheng Ting Hsu, H. J. Chuang
Mitigation of voltage variation by REMS for distribution feeders. IAS (2016)
Kai-Shin Li, Ming-Taou Lee, Min-Cheng Chen, Cho-Lun Hsu, J. M. Lu, C. H. Lin, C. C. Chen, B. W. Wu, Y. F. Hou, C. Yi. Lin, Y. J. Chen, T. Y. Lai, M. Y. Li, I. Yang, C. S. Wu, Fu-Liang Yang, W. K. Yeh
Study of sub-5 nm RRAM, tunneling selector and selector less device. ISCAS (2015)
D. S. Liu, Y. C. Chao, C. H. Lin, G. S. Shen, H. S. Liu
Numerical study on the bonding tool position, tip profile and planarity angle influences on TAB/ILB interconnection reliability. Microelectron. Reliab. 43 (6) (2003)