F. Lorut

Publication Activity (10 Years)

Years Active: 2013-2013
Publications (10 Years): 0

Top Topics

Electrical Properties

Top Venues

Microelectron. Reliab.

Publications

T. Frank, Stéphane Moreau, Cédrick Chappaz, Patrick Leduc, Lucile Arnaud, Aurélie Thuaire, E. Chery, F. Lorut, Lorena Anghel, Gilles Poupon
Reliability of TSV interconnects: Electromigration, thermal cycling, and impact on above metal level dielectric. Microelectron. Reliab. 53 (1) (2013)