Dean G. Jarrett

Publication Activity (10 Years)

Years Active: 1999-2023
Publications (10 Years): 8

Top Topics

National Institute Of Standards And Technology

Electronic Devices

Physical Characteristics

Top Venues

IEEE Trans. Instrum. Meas.

IEEE Instrum. Meas. Mag.

Publications

Dean G. Jarrett, Ching-Chen Yeh, Shamith U. Payagala, Alireza R. Panna, Yanfei Yang, Linli Meng, Swapnil M. Mhatre, Ngoc Thanh Mai Tran, Heather M. Hill, Dipanjan Saha, Randolph E. Elmquist, David B. Newell, Albert F. Rigosi
Graphene-Based Star-Mesh Resistance Networks. IEEE Trans. Instrum. Meas. 72 (2023)
Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang
Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge. IEEE Trans. Instrum. Meas. 71 (2022)
Shamith U. Payagala, Albert F. Rigosi, Alireza R. Panna, Alessio Pollarolo, Mattias Kruskopf, Stephan Schlamminger, Dean G. Jarrett, Ryan Brown, Randolph E. Elmquist, Duane Brown, David B. Newell
Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe. IEEE Trans. Instrum. Meas. 69 (12) (2020)
Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. IEEE Trans. Instrum. Meas. 69 (6) (2020)
Kwang Min Yu, Dean G. Jarrett, Andrew D. Koffman, Albert F. Rigosi, Shamith U. Payagala, Kwon Sang Ryu, Jeon Hong Kang, Sang Hwa Lee
Using a Natural Ratio to Compare DC and AC Resistances. IEEE Trans. Instrum. Meas. 69 (8) (2020)
Kwang Min Yu, Dean G. Jarrett, Albert F. Rigosi, Shamith U. Payagala, Marlin Kraft
Comparison of Multiple Methods for Obtaining P $\Omega$ Resistances With Low Uncertainties. IEEE Trans. Instrum. Meas. 69 (6) (2020)
Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist
Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards. IEEE Trans. Instrum. Meas. 68 (6) (2019)
Stephan Schlamminger, Patrick Abbott, Zeina Kubarych, Dean G. Jarrett, Randolph E. Elmquist
The units for mass, voltage, resistance, and electrical current in the SI. IEEE Instrum. Meas. Mag. 22 (3) (2019)
Dean G. Jarrett
Report to TIM Editor on CPEM 2012. IEEE Trans. Instrum. Meas. 62 (6) (2013)
Dean G. Jarrett, Randolph E. Elmquist, Nien Fan Zhang, Alejandra Tonina, Marta Porfiri, Janice de Brito Fernandes, Helio Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, David Inglis, Kai Wendler, Felipe Hernandez Marquez, Benjamín Rodríguez Medina
SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ. IEEE Trans. Instrum. Meas. 58 (4) (2009)
Randolph E. Elmquist, Emmanouel Hourdakis, Dean G. Jarrett, Neil M. Zimmerman
Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator. IEEE Trans. Instrum. Meas. 54 (2) (2005)
Dean G. Jarrett, Ronald F. Dziuba
CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards. IEEE Trans. Instrum. Meas. 52 (2) (2003)
Nien Fan Zhang, Nell Sedransk, Dean G. Jarrett
Statistical uncertainty analysis of key comparison CCEM-K2. IEEE Trans. Instrum. Meas. 52 (2) (2003)
Randolph E. Elmquist, Anne-Marie Jeffery, Dean G. Jarrett
Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory. IEEE Trans. Instrum. Meas. 50 (2) (2001)
Dean G. Jarrett
Analysis of a dual-balance high-resistance bridge at 10 TΩ. IEEE Trans. Instrum. Meas. 50 (2) (2001)
Ronald F. Dziuba, Dean G. Jarrett, Lisa L. Scott, Andrew J. Secula
Fabrication of high-value standard resistors. IEEE Trans. Instrum. Meas. 48 (2) (1999)
Dean G. Jarrett
Evaluation of guarded high-resistance Hamon transfer standards. IEEE Trans. Instrum. Meas. 48 (2) (1999)