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SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ.

Dean G. JarrettRandolph E. ElmquistNien Fan ZhangAlejandra ToninaMarta PorfiriJanice de Brito FernandesHelio SchechterDaniel IzquierdoCarlos FaverioDaniel SlomovitzDavid InglisKai WendlerFelipe Hernandez MarquezBenjamín Rodríguez Medina
Published in: IEEE Trans. Instrum. Meas. (2009)
Keyphrases
  • quantitative evaluation
  • data sets
  • learning algorithm
  • three dimensional
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  • multiscale
  • widely accepted
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  • neural network
  • real world
  • computer vision
  • metadata
  • data structure