Randolph E. Elmquist

Publication Activity (10 Years)

Years Active: 1999-2023
Publications (10 Years): 5

Top Topics

Electrical Properties

Top Venues

IEEE Trans. Instrum. Meas.

IEEE Instrum. Meas. Mag.

Publications

Dean G. Jarrett, Ching-Chen Yeh, Shamith U. Payagala, Alireza R. Panna, Yanfei Yang, Linli Meng, Swapnil M. Mhatre, Ngoc Thanh Mai Tran, Heather M. Hill, Dipanjan Saha, Randolph E. Elmquist, David B. Newell, Albert F. Rigosi
Graphene-Based Star-Mesh Resistance Networks. IEEE Trans. Instrum. Meas. 72 (2023)
Shamith U. Payagala, Albert F. Rigosi, Alireza R. Panna, Alessio Pollarolo, Mattias Kruskopf, Stephan Schlamminger, Dean G. Jarrett, Ryan Brown, Randolph E. Elmquist, Duane Brown, David B. Newell
Comparison Between Graphene and GaAs Quantized Hall Devices With a Dual Probe. IEEE Trans. Instrum. Meas. 69 (12) (2020)
Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. IEEE Trans. Instrum. Meas. 69 (6) (2020)
Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Mattias Kruskopf, Marlin Kraft, George R. Jones, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Jiuning Hu, Dean G. Jarrett, David B. Newell, Randolph E. Elmquist
Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards. IEEE Trans. Instrum. Meas. 68 (6) (2019)
Stephan Schlamminger, Patrick Abbott, Zeina Kubarych, Dean G. Jarrett, Randolph E. Elmquist
The units for mass, voltage, resistance, and electrical current in the SI. IEEE Instrum. Meas. Mag. 22 (3) (2019)
Yasuhiro Fukuyama, Randolph E. Elmquist, Lung-I Huang, Yanfei Yang, Fan-Hung Liu, Nobu-hisa Kaneko
Controlling the Fermi Level in a Single-Layer Graphene QHE Device for Resistance Standard. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Nobu-hisa Kaneko, Takehiko Oe, Wan-Seop Kim, Dong-Hun Chae, Randolph E. Elmquist, Marlin Kraft
Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Mariano A. Real, Eric A. Lass, Fan-Hung Liu, Tian Shen, George R. Jones, Johannes A. Soons, David B. Newell, Albert V. Davydov, Randolph E. Elmquist
Graphene Epitaxial Growth on SiC(0001) for Resistance Standards. IEEE Trans. Instrum. Meas. 62 (6) (2013)
Gert Rietveld, Jan H. N. van der Beek, Marlin Kraft, Randolph E. Elmquist, Alessandro Mortara, Beat Jeckelmann
Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior. IEEE Trans. Instrum. Meas. 62 (6) (2013)
M. E. Bierzychudek, Randolph E. Elmquist
Uncertainty Evaluation in a Two-Terminal Cryogenic Current Comparator. IEEE Trans. Instrum. Meas. 58 (4) (2009)
Dean G. Jarrett, Randolph E. Elmquist, Nien Fan Zhang, Alejandra Tonina, Marta Porfiri, Janice de Brito Fernandes, Helio Schechter, Daniel Izquierdo, Carlos Faverio, Daniel Slomovitz, David Inglis, Kai Wendler, Felipe Hernandez Marquez, Benjamín Rodríguez Medina
SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ. IEEE Trans. Instrum. Meas. 58 (4) (2009)
Randolph E. Elmquist, Emmanouel Hourdakis, Dean G. Jarrett, Neil M. Zimmerman
Direct resistance comparisons from the QHR to100 MΩ using a cryogenic current comparator. IEEE Trans. Instrum. Meas. 54 (2) (2005)
Randolph E. Elmquist, Neil M. Zimmerman, William H. Huber
Using a high-value resistor in triangle comparisons of electrical standards. IEEE Trans. Instrum. Meas. 52 (2) (2003)
Randolph E. Elmquist, Anne-Marie Jeffery, Dean G. Jarrett
Characterization of four-terminal-pair resistance standards: a comparison of measurements and theory. IEEE Trans. Instrum. Meas. 50 (2) (2001)
Bernd Schumacher, Peter Warnecke, Wilfrid Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinski
Transport behavior of commercially available 100-Ω standard resistors. IEEE Trans. Instrum. Meas. 50 (2) (2001)
Randolph E. Elmquist
Calculable coaxial resistors for precision measurements. IEEE Trans. Instrum. Meas. 49 (2) (2000)
Randolph E. Elmquist
Cryogenic current comparator measurements at 77 K using thallium-2223 thick-film shields. IEEE Trans. Instrum. Meas. 48 (2) (1999)