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Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior.
Gert Rietveld
Jan H. N. van der Beek
Marlin Kraft
Randolph E. Elmquist
Alessandro Mortara
Beat Jeckelmann
Published in:
IEEE Trans. Instrum. Meas. (2013)
Keyphrases
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reinforcement learning
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measurement error