Nobu-hisa Kaneko

Publication Activity (10 Years)

Years Active: 2007-2023
Publications (10 Years): 27

Top Topics

Inertia Weight Particle Swarm Optimization

Integrated Circuit

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Daiki Matsumaru, Shuji Nakamura, Michitaka Maruyama, Nobu-hisa Kaneko
Stable Voltage Generation With a Josephson Voltage Standard Device Cooled at a 4 K Stage in a Dilution Refrigerator. IEEE Trans. Instrum. Meas. 72 (2023)
Yasutaka Amagai, Kenjiro Okawa, Norihiko Sakamoto, Nobu-hisa Kaneko
Signal-to-Noise Ratio Optimization for Planar Multijunction Thermal Converters. IEEE Trans. Instrum. Meas. 72 (2023)
Shuji Nakamura, Daiki Matsumaru, Gento Yamahata, Takehiko Oe, Yuma Okazaki, Shintaro Takada, Michitaka Maruyama, Akira Fujiwara, Nobu-hisa Kaneko
Cryogenic Operation of Electromechanical Relay for Reversal of Quantized Current Generated by a Single-Electron Pump. IEEE Trans. Instrum. Meas. 72 (2023)
Yuma Okazaki, Takahiro Tanaka, Norio Saito, Nobu-hisa Kaneko
Subfemtoampere Resolved Ionization Current Measurements Using a High-Resistance Transimpedance Amplifier. IEEE Trans. Instrum. Meas. 71 (2022)
Vladimir Bubanja, Yasutaka Amagai, Kenjiro Okawa, Nobu-hisa Kaneko
Mathematical Modeling and Measurement of Low Frequency Characteristics of Single-Junction Thermal Converters. IEEE Trans. Instrum. Meas. 71 (2022)
Yasutaka Amagai, Stefan Cular, Joseph A. Hagmann, Thomas E. Lipe, Nobu-hisa Kaneko
Low-Frequency Characteristics of Silicon-Based High-Current Multijunction Thermal Current Converters Fabricated by Wet Chemical Etching. IEEE Trans. Instrum. Meas. 70 (2021)
Takehiko Oe, Albert F. Rigosi, Mattias Kruskopf, Bi-Yi Wu, Hsin-Yen Lee, Yanfei Yang, Randolph E. Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett
Comparison Between NIST Graphene and AIST GaAs Quantized Hall Devices. IEEE Trans. Instrum. Meas. 69 (6) (2020)
Chiharu Urano, Kazuaki Yamazawa, Nobu-hisa Kaneko
Measurement of the Melting Point of Gallium Using a Johnson Noise Thermometer. IEEE Trans. Instrum. Meas. 69 (6) (2020)
Yasutaka Amagai, Hiroyuki Fujiki, Kenjiro Okawa, Nobu-hisa Kaneko
Low-Frequency AC-DC Differences of a Series-Parallel Circuit of Thermal Converters. IEEE Trans. Instrum. Meas. 68 (6) (2019)
Takayuki Abe, Takehiko Oe, Masaya Kumagai, Matsuo Zama, Nobu-hisa Kaneko
Characterization of $1~\mathrm{k}\Omega$ Metal-Foil Standard Resistors and Continuing Drift-Rate Evaluation of 1 $\Omega$ and $10~\Omega$ Standard Resistors. IEEE Trans. Instrum. Meas. 68 (6) (2019)
Tetsuro Misawa, Yasuhiro Fukuyama, Yuma Okazaki, Shuji Nakamura, Nariaki Nasaka, Takao Sasagawa, Nobu-hisa Kaneko
Preparation and Characterization of Sn-BSTS Topological Insulator for Universality Test of the Quantum Hall Effect. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Takehiko Oe, Sucheta Gorwadkar, Taro Itatani, Nobu-hisa Kaneko
Development of 1 MΩ Quantum Hall Array Resistance Standards. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Nobu-hisa Kaneko, Takehiko Oe, Takayuki Abe, Masaya Kumagai, Matsuo Zama
Development of 1~Ω and 10~Ω Metal-Foil Standard Resistors. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Yasuhiro Fukuyama, Norihiko Sakamoto, Takaya Kondo, Masanori Onuma, Nobu-hisa Kaneko
Study of Contact Resistance in Connectors With Physical Simulation Using Nanofabrication. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Takehiko Oe, Atsushi Domae, Norihiko Sakamoto, Nobu-hisa Kaneko
Evaluation of Automatic Coaxial Mechanical Scanners for Precise Resistance and Capacitance Measurements. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Chiharu Urano, Takahiro Yamada, Masaaki Maezawa, Kazuaki Yamazawa, Nobu-hisa Kaneko
Measuring the Boltzmann's Constant Using Superconducting Integrated Circuit. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Atsushi Domae, Takehiko Oe, Syogo Kiryu, Nobu-hisa Kaneko
Experimental Demonstration of Current Dependence Evaluation of Voltage Divider Based on Quantized Hall Resistance Voltage Divider. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Shuji Nakamura, Yuri A. Pashkin, Jaw-Shen Tsai, Nobu-hisa Kaneko
Single-Electron Pumping by Parallel SINIS Turnstiles for Quantum Current Standard. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Yasuhiro Fukuyama, Randolph E. Elmquist, Lung-I Huang, Yanfei Yang, Fan-Hung Liu, Nobu-hisa Kaneko
Controlling the Fermi Level in a Single-Layer Graphene QHE Device for Resistance Standard. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Takehiko Oe, Chiharu Urano, Nobu-hisa Kaneko, Hiroshi Eisaki, Yoshiyuki Yoshida, Atsushi Yamamoto, Koshi Takenaka
Antiperovskite Manganese Nitride Standard Resistor. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Michitaka Maruyama, Akio Iwasa, Hirotake Yamamori, Shih-Fang Chen, Chiharu Urano, Nobu-hisa Kaneko
Calibration System for Zener Voltage Standards Using a 10 V Programmable Josephson Voltage Standard at NMIJ. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Atsushi Domae, Takayuki Abe, Masaya Kumagai, Matsuo Zama, Takehiko Oe, Nobu-hisa Kaneko
Development and Evaluation of High-Stability Metal-Foil Resistor With a Resistance of 1 kΩ. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Michitaka Maruyama, Hikari Takahashi, Kenichi Katayama, Takahito Yonezawa, Takahiro Kanai, Akio Iwasa, Chiharu Urano, Shogo Kiryu, Nobu-hisa Kaneko
Evaluation of Linearity Characteristics in Digital Voltmeters Using a PJVS System With a 10-K Cooler. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Atsushi Domae, Norihiko Sakamoto, Syogo Kiryu, Nobu-hisa Kaneko
Development of 7.75 Ratio Voltage Divider Toward a Precise Measurement of Decade Resistance Based on the AC Quantized Hall Resistance. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Shih-Fang Chen, Yasutaka Amagai, Michitaka Maruyama, Nobu-hisa Kaneko
Uncertainty Evaluation of a 10 V RMS Sampling Measurement System Using the AC Programmable Josephson Voltage Standard. IEEE Trans. Instrum. Meas. 64 (12) (2015)
Nobu-hisa Kaneko, Takehiko Oe, Wan-Seop Kim, Dong-Hun Chae, Randolph E. Elmquist, Marlin Kraft
Transportation Effect and Basic Characteristics of Metal-Foil Resistors Examined in an International Trilateral Pilot Study. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Yasutaka Amagai, Atsushi Yamamoto, Megumi Akoshima, Hiroyuki Fujiki, Nobu-hisa Kaneko
AC/DC Transfer Technique for Measuring Thomson Coefficient: Toward Thermoelectric Metrology. IEEE Trans. Instrum. Meas. 64 (6) (2015)
Takehiko Oe, Chiharu Urano, Motoyoshi Hadano, Atsushi Ozawa, Koshi Takenaka, Nobu-hisa Kaneko
N Antiperovskite Compound Fabrication for Resistance Standard. IEEE Trans. Instrum. Meas. 62 (6) (2013)
Takehiko Oe, Kenjiro Matsuhiro, Taro Itatani, Sucheta Gorwadkar, Shogo Kiryu, Nobu-hisa Kaneko
New Design of Quantized Hall Resistance Array Device. IEEE Trans. Instrum. Meas. 62 (6) (2013)
Atsushi Domae, Takehiko Oe, Masaya Kumagai, Matsuo Zama, Nobu-hisa Kaneko
Characterization of 100-Ω Metal Foil Standard Resistors. IEEE Trans. Instrum. Meas. 62 (6) (2013)
Nobu-hisa Kaneko, Atsushi Domae, Takehiko Oe, Jürgen Schurr, Franz-Josef Ahlers, Shogo Kiryu
First Attempt to Develop an On-Chip Double-Shielded QHR Device for Use in AC Measurements. IEEE Trans. Instrum. Meas. 62 (6) (2013)
Shinsuke Shimamoto, Yuichi Naitou, Yasuhiro Fukuyama, Shogo Kiryu, Nobu-hisa Kaneko
Native Graphene Oxides at Graphene Edges. IEEE Trans. Instrum. Meas. 62 (6) (2013)
Nobu-hisa Kaneko, Michitaka Maruyama, Chiharu Urano
Current Status of Josephson Arbitrary Waveform Synthesis at NMIJ/AIST. IEICE Trans. Electron. (3) (2011)
Takehiko Oe, Kenjiro Matsuhiro, Taro Itatani, Sucheta Gorwadkar, Shogo Kiryu, Nobu-hisa Kaneko
Development of Quantum Hall Array Resistance Standards at NMIJ. IEEE Trans. Instrum. Meas. 60 (7) (2011)
Yasuhiko Sakamoto, Nobu-hisa Kaneko, Takehiko Oe, Masaya Kumagai, Matsuo Zama
Novel 100-Omega Metal Foil Resistor. IEEE Trans. Instrum. Meas. 60 (7) (2011)
Chiharu Urano, Nobu-hisa Kaneko, Masaaki Maezawa, Taro Itatani, Sucheta Gorwadkar, Hiroshi Saitou, J. Maeda, Shogo Kiryu
Observation of Quantized Voltage Steps Using a Josephson Junction Array Driven by Optoelectronically Generated Pulses. IEEE Trans. Instrum. Meas. 56 (2) (2007)