Characterization of $1~\mathrm{k}\Omega$ Metal-Foil Standard Resistors and Continuing Drift-Rate Evaluation of 1 $\Omega$ and $10~\Omega$ Standard Resistors.
Takayuki AbeTakehiko OeMasaya KumagaiMatsuo ZamaNobu-hisa KanekoPublished in: IEEE Trans. Instrum. Meas. (2019)