Jonathan M. Williams

Publication Activity (10 Years)

Years Active: 1999-2022
Publications (10 Years): 3

Top Topics

Quantum Computation

Top Venues

IEEE Trans. Instrum. Meas.

BMC Medical Imaging

Medical Biol. Eng. Comput.

Publications

Andrew A. Watt, Andrew J. Callaway, Jonathan M. Williams
In vivo through-range passive stiffness of the lumbar spine: a meta-analysis of measurements and methods. Medical Biol. Eng. Comput. 60 (8) (2022)
Raphael Roger, Melissa A. Hilmes, Jonathan M. Williams, Daniel J. Moore, Alvin C. Powers, R. Cameron Craddock, John Virostko
Deep learning-based pancreas volume assessment in individuals with type 1 diabetes. BMC Medical Imaging 22 (1) (2022)
Jane Ireland, Jonathan M. Williams, Oliver F. Kieler, Ralf Behr, Ernest Houtzager, Ralph Hornecker, Helko E. van den Brom
An Optoelectronic Pulse Drive for Quantum Voltage Synthesizer. IEEE Trans. Instrum. Meas. 68 (6) (2019)
Jonathan M. Williams, Gert Rietveld, Ernest Houtzager, Theodoor J. B. M. Janssen
Design Considerations for a CCC Bridge With Complete Digital Control. IEEE Trans. Instrum. Meas. 60 (12) (2011)
Stephen P. Giblin, Jonathan M. Williams
Automation of a Coaxial Bridge for Calibration of AC Resistors. IEEE Trans. Instrum. Meas. 56 (2) (2007)
Jonathan M. Williams, Dale Henderson, Pravin Patel, Ralf Behr, Luis Palafox
Achieving Sub-100-ns Switching of Programmable Josephson Arrays. IEEE Trans. Instrum. Meas. 56 (2) (2007)
Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus, Bryan C. Waltrip, Thomas L. Nelson, Yonuk Chong, Jonathan M. Williams, Dale Henderson, Pravin Patel, Luis Palafox, Ralf Behr
Development of a 60 Hz Power Standard Using SNS Programmable Josephson Voltage Standards. IEEE Trans. Instrum. Meas. 56 (2) (2007)
Nick E. Fletcher, Stephen P. Giblin, Jonathan M. Williams, K. J. Lines
New Capability for Generating and Measuring Small DC Currents at NPL. IEEE Trans. Instrum. Meas. 56 (2) (2007)
Giancarlo Marullo-Reedtz, Roberto Cerri, Wolfgang Waldmann, Jiri Streit, Pekka Immonen, Isabelle Blanc, Felix Raso, Torsten Funck, Bernd Schumacher, Erik F. Dierikx, Mario Nunes, Peter Vrabcek, Dusan Rudohradsky, Ove Gunnarsson, Karl-Erik Rydler, Blaise Jeanneret, Beat Jeckelmann, Thomas Pulfer, Saliha Selcik Turhan, Okan Yilmaz, Jonathan M. Williams, Harald Slinde, Kåre Lind, Jacques Nicolas, Matjaz Lindic, Eirini Flouda, Gábor Erdös
Comparison EUROMET.EM-K8 of DC voltage ratio: results. IEEE Trans. Instrum. Meas. 54 (2) (2005)
Ralf Behr, Jonathan M. Williams, Pravin Patel, Theodoor J. B. M. Janssen, Torsten Funck, Manfred Klonz
Synthesis of precision waveforms using a SINIS Josephson junction array. IEEE Trans. Instrum. Meas. 54 (2) (2005)
Waldemar G. Kürten, Enrico Mohns, Ralf Behr, Jonathan M. Williams, Pravin Patel, Günther Ramm, Hans Bachmair
Characterization of a high-resolution analog-to-digital converter with a Josephson AC voltage source. IEEE Trans. Instrum. Meas. 54 (2) (2005)
Oleg A. Chevtchenko, Helko E. van den Brom, Ernest Houtzager, Ralf Behr, Johannes Kohlmann, Jonathan M. Williams, Theodoor J. B. M. Janssen, Luis Palafox, David A. Humphreys, François P. M. Piquemal, Sophie Djordjevic, O. Monnoye, André Poletaeff, Rado Lapuh, Karl-Erik Rydler, Gunnar Eklund
Realization of a quantum standard for AC voltage: overview of a European research project. IEEE Trans. Instrum. Meas. 54 (2) (2005)
Jürgen Melcher, Jürgen Schurr, Klaus Pierz, Jonathan M. Williams, Stephen P. Giblin, Franco Cabiati, Luca Callegaro, Giancarlo Marullo-Reedtz, Cristina Cassiago, Beat Jeckelmann, Blaise Jeanneret, Frédéric Overney, Jaroslav Bohacek, J. Riha, O. Power, J. Murray, Mario Nunes, M. Lobo, I. Godinho
The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect. IEEE Trans. Instrum. Meas. 52 (2) (2003)
Giancarlo Marullo-Reedtz, Roberto Cerri, Isabelle Blanc, Ove Gunnarsson, Jonathan M. Williams, Felix Raso, Kyu-Tae Kim, Robert B. Frenkel, Zhang Xiuzeng, Alexander S. Katkov, Ronald Dziuba, Mark Parker, Barry M. Wood, Laurie A. Christian, Eddie Tarnow, Surender K. Mahajan, Ajeet Singh, Yasuhiko Sakamoto
Comparison CCEM-K8 of DC voltage ratio: results. IEEE Trans. Instrum. Meas. 52 (2) (2003)
Ralf Behr, Johannes Kohlmann, Theodoor J. B. M. Janssen, Peter Kleinschmidt, Jonathan M. Williams, Sophie Djordjevic, Jean-Pierre Lo-Hive, François P. M. Piquemal, Per-Otto Hetland, Dominique Reymann, Gunnar Eklund, Christian Hof, Blaise Jeanneret, Oleg A. Chevtchenko, Ernest Houtzager, Helko E. van den Brom, Andrea Sosso, Domenico Andreone, Jaani Nissilä, Panu Helistö
Analysis of different measurement setups for a programmable Josephson voltage standard. IEEE Trans. Instrum. Meas. 52 (2) (2003)
Bernd Schumacher, Peter Warnecke, Wilfrid Poirier, I. Delgado, Z. Msimang, Giorgio Boella, Per-Otto Hetland, Randolph E. Elmquist, Jonathan M. Williams, David Inglis, Beat Jeckelmann, Ove Gunnarsson, Alexandre Satrapinski
Transport behavior of commercially available 100-Ω standard resistors. IEEE Trans. Instrum. Meas. 50 (2) (2001)
Jonathan M. Williams, Peter Kleinschmidt
A cryogenic current comparator bridge for resistance measurements at currents of up to 100 A. IEEE Trans. Instrum. Meas. 48 (2) (1999)