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Using a Natural Ratio to Compare DC and AC Resistances.
Kwang Min Yu
Dean G. Jarrett
Andrew D. Koffman
Albert F. Rigosi
Shamith U. Payagala
Kwon Sang Ryu
Jeon Hong Kang
Sang Hwa Lee
Published in:
IEEE Trans. Instrum. Meas. (2020)
Keyphrases
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integrated circuit
real world
high level
learning environment
image compression
neural network
search engine
image processing
case study
multiscale
digital libraries
arc consistency