Andrew D. Koffman

Publication Activity (10 Years)

Years Active: 2000-2024
Publications (10 Years): 5

Top Topics

Top Venues

IEEE Trans. Instrum. Meas.

Publications

Stephan Schlamminger, J. Love, Andrew D. Koffman, Y. Wang
Four Terminal-Pair Measurements of Ceramic Capacitors. I2MTC (2024)
Stephan Schlamminger, Andrew D. Koffman, James W. Schmidt, Bryan C. Waltrip, Yicheng Wang
Measurement of the Frequency Dependence of Four Terminal-Pair Air Capacitors With a Vector Network Analyzer. IEEE Trans. Instrum. Meas. 72 (2023)
Mona Feige, Stephan Schlamminger, Andrew D. Koffman, Dean G. Jarrett, Shamith U. Payagala, Alireza R. Panna, Bryan C. Waltrip, Mike Berilla, Frank Seifert, Yicheng Wang
Comparison of a 100-pF Capacitor With a 12 906-Ω Resistor Using a Digital Impedance Bridge. IEEE Trans. Instrum. Meas. 71 (2022)
Kwang Min Yu, Dean G. Jarrett, Andrew D. Koffman, Albert F. Rigosi, Shamith U. Payagala, Kwon Sang Ryu, Jeon Hong Kang, Sang Hwa Lee
Using a Natural Ratio to Compare DC and AC Resistances. IEEE Trans. Instrum. Meas. 69 (8) (2020)
Yinan Yu, Andrew D. Koffman, Yicheng Wang
Nonlinearity Testing of Capacitance Bridges Using Programmable Capacitors. IEEE Trans. Instrum. Meas. 66 (6) (2017)
Svetlana Avramov-Zamurovic, Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang
Evaluation of a Capacitance Scaling System. IEEE Trans. Instrum. Meas. 56 (6) (2007)
Yicheng Wang, Andrew D. Koffman, Gerald J. FitzPatrick
Dissipation Factors of Fused-Silica Capacitors in the Audio Frequency Range. IEEE Trans. Instrum. Meas. 56 (2) (2007)
Anne-Marie Jeffery, Andrew D. Koffman
Improved 1-kHz capacitance calibration uncertainty. IEEE Trans. Instrum. Meas. 52 (4) (2003)
Svetlana Avramov-Zamurovic, Andrew D. Koffman, Nile M. Oldham, Bryan Cristopher Waltrip
The sensitivity of a method to predict a capacitor's frequency characteristic. IEEE Trans. Instrum. Meas. 49 (2) (2000)
Andrew D. Koffman, Svetlana Avramov-Zamurovic, Bryan Cristopher Waltrip, Nile M. Oldham
Uncertainty analysis for four terminal-pair capacitance and dissipation factor characterization at 1 and 10 MHz. IEEE Trans. Instrum. Meas. 49 (2) (2000)