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CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards.

Dean G. JarrettRonald F. Dziuba
Published in: IEEE Trans. Instrum. Meas. (2003)
Keyphrases
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  • management system
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  • data sets
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  • artificial intelligence
  • objective function
  • control system
  • key technologies