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Comparison of Multiple Methods for Obtaining P $\Omega$ Resistances With Low Uncertainties.
Kwang Min Yu
Dean G. Jarrett
Albert F. Rigosi
Shamith U. Payagala
Marlin Kraft
Published in:
IEEE Trans. Instrum. Meas. (2020)
Keyphrases
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machine learning methods
significant improvement
data mining
face recognition
training set
text classification
qualitative and quantitative
social networks
probabilistic model
dimensionality reduction
image quality
cross validation