Charles S. Whitman

Publication Activity (10 Years)

Years Active: 2003-2017
Publications (10 Years): 1

Top Topics

Reliability Analysis

Top Venues

Microelectron. Reliab.

Publications

Charles S. Whitman, Michael G. Meeder, Peter J. Zampardi
Determination of safe reliability region over temperature and current density for through wafer vias. Microelectron. Reliab. 68 (2017)
Charles S. Whitman
Methodology for predicting off-state reliability in GaN power transistors. Microelectron. Reliab. 54 (2) (2014)
Charles S. Whitman
Impact of ambient temperature set point deviation on Arrhenius estimates. Microelectron. Reliab. 52 (1) (2012)
Charles S. Whitman
Prediction of transmission line lifetimes over temperature and current density. Microelectron. Reliab. 49 (5) (2009)
Charles S. Whitman
Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method. Microelectron. Reliab. 48 (7) (2008)
Leslie Marchut, Charles S. Whitman
Acceleration factors for THB induced degradation of AlGaAs/InGaAs pHEMT devices. Microelectron. Reliab. 48 (7) (2008)
Charles S. Whitman
Defining the safe operating area for HBTs with an InGaP emitter across temperature and current density. Microelectron. Reliab. 47 (8) (2007)
Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell
Determining factors affecting ESD failure voltage using DOE. Microelectron. Reliab. 46 (8) (2006)
Charles S. Whitman
Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271]. Microelectron. Reliab. 46 (12) (2006)
Charles S. Whitman
Reliability results of HBTs with an InGaP emitter. Microelectron. Reliab. 46 (8) (2006)
Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell
Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. Microelectron. Reliab. 46 (12) (2006)
Charles S. Whitman, Michael Meeder
Determining constant voltage lifetimes for silicon nitride capacitors in a GaAs IC process by a step stress method. Microelectron. Reliab. 45 (12) (2005)
Charles S. Whitman
Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares. Microelectron. Reliab. 43 (6) (2003)