Estimating effective dielectric thickness for capacitors with extrinsic defects by a statistical method.
Charles S. WhitmanPublished in: Microelectron. Reliab. (2008)
Keyphrases
- statistical information
- high accuracy
- significant improvement
- computational cost
- experimental evaluation
- computationally efficient
- statistical model
- synthetic data
- support vector machine svm
- data sets
- dynamic programming
- cost function
- preprocessing
- high precision
- classification method
- highly efficient
- method assumes
- segmentation method
- edge detection
- detection method
- mutual information
- probabilistic model
- bayesian networks
- similarity measure
- feature selection
- neural network