Jennifer A. Antonell

Publication Activity (10 Years)

Years Active: 2006-2006
Publications (10 Years): 0

Publications

Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell
Determining factors affecting ESD failure voltage using DOE. Microelectron. Reliab. 46 (8) (2006)
Charles S. Whitman, Terri M. Gilbert, Ann M. Rahn, Jennifer A. Antonell
Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. Microelectron. Reliab. 46 (12) (2006)