Login / Signup

Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 (2006) 1261-1271].

Charles S. Whitman
Published in: Microelectron. Reliab. (2006)
Keyphrases
  • website
  • database systems
  • failure rate
  • highly reliable
  • reliability analysis
  • real time
  • search algorithm
  • high density