Aristeidis Nikolaou

Publication Activity (10 Years)

Years Active: 2018-2022
Publications (10 Years): 7

Top Topics

Chemical Vapor Deposition

Top Venues

Publications

Aristeidis Nikolaou, Jakob Leise, Jakob Pruefer, Ute Zschieschang, Hagen Klauk, Ghader Darbandy, Benjamín Iñíguez, Alexander Kloes
Impact of Mechanical Bending on the Performance of Organic Thin-Film Transistors and the Characteristic Temperature of the Density of States. MIXDES (2022)
Aristeidis Nikolaou, Jakob Leise, Jakob Pruefer, Ute Zschieschang, Hagen Klauk, Ghader Darbandy, Benjamín Iñíguez, Alexander Kloes
Variability-Aware Characterization of Current Mirrors Based on Organic Thin-Film Transistors on Flexible Substrates. MIXDES (2021)
Alexia Papadopoulou, Nikolaos Makris, Loukas Chevas, Aristeidis Nikolaou, Matthias Bucher
Design of Micropower Operational Transconductance Amplifiers for High Total Ionizing Dose Effects. MOCAST (2019)
Aristeidis Nikolaou, Loukas Chevas, Alexia Papadopoulou, Nikolaos Makris, Matthias Bucher, Giulio Borghello, Federico Faccio
Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose. MIXDES (2019)
Wladek Grabinski, Ahmed Abo-Elhadid, Marek Mierzwinski, Laurent Lemaitre, Mike Brinson, Christophe Lallement, Jean-Michel Sallese, Sadayuki Yoshitomi, Paul Malisse, Henri Oguey, Stefan Cserveny, Marcelo Antonio Pavanello, Christian C. Enz, François Krummenacher, Eric A. Vittoz, Michelly de Souza, Daniel Tomaszewski, Jolanta Malesinska, Grzegorz Gluszko, Matthias Bucher, Nikolaos Makris, Aristeidis Nikolaou
FOSS EKV2.6 Verilog-A Compact MOSFET Model. ESSDERC (2019)
Aristeidis Nikolaou, Matthias Bucher, Nikos Makris, Alexia Papadopoulou, Loukas Chevas, Giulio Borghello, Henri D. Koch, Kostas Kloukinas, Tuomas S. Poikela, Federico Faccio
Extending a 65nm CMOS process design kit for high total ionizing dose effects. MOCAST (2018)
Loukas Chevas, Aristeidis Nikolaou, Matthias Bucher, Nikolaos Makris, Alexia Papadopoulou, Apostolos Zografos, Giulio Borghello, Henri D. Koch, Federico Faccio
Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS. MIXDES (2018)