Extending a 65nm CMOS process design kit for high total ionizing dose effects.

Aristeidis Nikolaou Matthias Bucher Nikos Makris Alexia Papadopoulou Loukas Chevas Giulio Borghello Henri D. Koch Kostas Kloukinas Tuomas S. Poikela Federico Faccio

Published in: MOCAST (2018)

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