Federico Faccio

Publication Activity (10 Years)

Years Active: 2000-2019
Publications (10 Years): 4

Top Topics

Cmos Technology

Design Decisions

High Sensitivity

Top Venues

Publications

Aristeidis Nikolaou, Loukas Chevas, Alexia Papadopoulou, Nikolaos Makris, Matthias Bucher, Giulio Borghello, Federico Faccio
Forward and Reverse Operation of Enclosed-Gate MOSFETs and Sensitivity to High Total Ionizing Dose. MIXDES (2019)
Aristeidis Nikolaou, Matthias Bucher, Nikos Makris, Alexia Papadopoulou, Loukas Chevas, Giulio Borghello, Henri D. Koch, Kostas Kloukinas, Tuomas S. Poikela, Federico Faccio
Extending a 65nm CMOS process design kit for high total ionizing dose effects. MOCAST (2018)
Loukas Chevas, Aristeidis Nikolaou, Matthias Bucher, Nikolaos Makris, Alexia Papadopoulou, Apostolos Zografos, Giulio Borghello, Henri D. Koch, Federico Faccio
Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS. MIXDES (2018)
Giacomo Ripamonti, Stefano Michelis, Federico Faccio, Stefano Saggini, Adil Koukab, Maher Kayal
A Reliability and Efficiency Optimization System for Hard-Switching DC/DC Converters. NEWCAS (2018)
Stefano Michelis, B. Allongue, G. Blanchot, Simone Buso, Federico Faccio, C. Fuentes, A. Marchioro, S. Orlandi, Stefano Saggini, Giorgio Spiazzi, Maher Kayal
An 8W-2MHz buck converter with adaptive dead time tolerant to radiation and high magnetic field. ESSCIRC (2010)
Federico Faccio, Hugh J. Barnaby, Xiao J. Chen, Daniel M. Fleetwood, Laura Gonella, Michael L. McLain, Ronald D. Schrimpf
Total ionizing dose effects in shallow trench isolation oxides. Microelectron. Reliab. 48 (7) (2008)
Walter Snoeys, Giovanni Anelli, Michael Campbell, Eugenio Cantatore, Federico Faccio, Erik H. M. Heijne, Senior Pierre Jarron, Kostas Kloukinas, Alessandro Marchioro, Paulo Moreira, Thomas Toifl, Kenneth Wyllie
Integrated circuits for particle physics experiments. IEEE J. Solid State Circuits 35 (12) (2000)