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Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS.

Loukas ChevasAristeidis NikolaouMatthias BucherNikolaos MakrisAlexia PapadopoulouApostolos ZografosGiulio BorghelloHenri D. KochFederico Faccio
Published in: MIXDES (2018)
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