Abdessatar Abderrahman

Publication Activity (10 Years)

Years Active: 1994-2007
Publications (10 Years): 0

Publications

Abdessatar Abderrahman, Mohamad Sawan, Yvon Savaria, Abdelhakim Khouas
New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches. ICECS (2007)
Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska
Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18 (3) (1999)
Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska
CLP-based Multifrequency Test Generation for Analog Circuits. VTS (1997)
Abdessatar Abderrahman, Bozena Kaminska, Eduard Cerny
Optimization-based multifrequency test generation for analog circuits. J. Electron. Test. 9 (1-2) (1996)
Abdessatar Abderrahman, Bozena Kaminska, Yvon Savaria
Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits. EDAC-ETC-EUROASIC (1994)