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New Analog Test Metrics Based on Probabilistic and Deterministic Combination Approaches.
Abdessatar Abderrahman
Mohamad Sawan
Yvon Savaria
Abdelhakim Khouas
Published in:
ICECS (2007)
Keyphrases
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neural network
strengths and weaknesses
signal processing
database
data sets
social networks
image processing
case study
image segmentation
probabilistic model
test data
probabilistic approaches
dempster shafer theory of evidence