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Optimization-based multifrequency test generation for analog circuits.
Abdessatar Abderrahman
Bozena Kaminska
Eduard Cerny
Published in:
J. Electron. Test. (1996)
Keyphrases
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test generation
analog circuits
test cases
fault diagnosis
test sequences
symbolic execution
design automation
digital circuits
database
static analysis
genetic algorithm
image processing
high level
software testing